TRANSISTOR TESTING FIXTURE KRUB.411259.010
Transistor testing fixture is intended for connecting of standard
coax circuits of measuring devices to the pads of GaAS field-effect transistor chips and for
the analysis of low noise and low power transistor microwave parameters.
Alumina microstrip lines are used in transistor testing fixture.
The microstrips lines are ended by signal microprobes (as to say contact needles) made from
beryllium bronze. The microprobe inductance is 0.2…0.3 nH. The transistor pad dimensions are
not less 60x60 dB.
SPECIFICATION
| Frequency range, GHz | 0,1…12 |
| Losses in 10 % operating frequency band, no more, dB | 0,4 |
| Input-output isolation, not less, dB | 25 |
| VSWR of input/output in 10 % operating frequency band, no more, dB | 1,3 |
| Dissipated power of tested transistor, no more,W | 0,5 |
| Quantity of contacting cycles, not less | 2000 |
| Input and output connectors: | - socket with М6x0.75 screw, 3.5x1.52 mm coax, type IX
GOST 13317-89 or
- socket with 1.4" screw, 36 threads per inch (SMA-type) |
|
TM
